最新版本的Duma M²激光束传播分析仪提供了最大的灵活性和优越的测量能力，从紫外线到波长超过1.6微米的脉冲或连续波。
提供两种版本：
（1）折叠腔多轴刀口扫描传感器。
（2）使用类似折叠腔的基于摄像头的传感器。专门为脉冲激光器或连续波光束设计。
- Beam sizes up to 25 mm
- Wavelengths up to 2.7 microns
- Determination of M², waist location and waist diameter.
- Low & high power laser beams measurement.
- Up to 4 kWatts.
- In accordance with latest relevant ISO standards.
测量:
- Beam Propagation (M²)
- Beam Waist Location
- Beam Waist Diameter
- Divergence
- Rayleigh Range
- Waist Asymmetry
- Astigmatism
规格：
Input Beam
| Measuring Method | Knife-edge -7 blades mounted on a rotating drum |
| Measuring Parameters | Beam size,Power,3-D Reconstruction |
| Beam Propagation Parameters | BPP over up to 50mm range ,M2 and depth of focus |
| Optional | ND filters according to application |
Scaning Assembly Attachment
| Scaning Assembly Attachment | |
| Spectral Range | 350nm to 1100nm(Si version) |
| Beam Power Range | 100W~8000W with supplied internal filter(Si version) Continuous Operating Duration-Limited to 10 seconds |
| Number of Knife-edges | 7 |
| Beam size and max.power density at entrance: | Input diameter 8mm |
| max Power densitiy at input aperture 0.4kW/mm2 | |
| Minimal work distance for focused beams | 100mm distance between input aperture to measuring plane of sensor head closest location |
订购信息：
M2Beam-Si – measurement device for silicon range (350 – 1100nm)
M2Beam-UV – measurement device for silicon range (190 – 1100nm)
M2Beam-IR – measurement device for silicon range (800 – 1800nm)
M2Beam-U3-VIS-NIR – measurement device for 350-1600 nm CMOS based
M2Beam-UV-NIR – Special – consult factory.
SAM3-HP-M – beam sampler for high power beams
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